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VLSI Design and Test
- 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Engelsk Paperback

VLSI Design and Test

- 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Engelsk Paperback

803 kr
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Om denne bog

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.

The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

Product detaljer
Sprog:
Engelsk
Sider:
775
ISBN-13:
9789813297661
Indbinding:
Paperback
Udgave:
ISBN-10:
9813297662
Kategori:
Udg. Dato:
18 aug 2019
Længde:
0mm
Bredde:
155mm
Højde:
235mm
Forlag:
Springer Verlag, Singapore
Oplagsdato:
18 aug 2019
Forfatter(e):
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