Store besparelser
Hurtig levering
Fri fragt over 499,-
Gemte
Log ind
0
Kurv
Kurv
Characterization of High Tc Materials and Devices by Electron Microscopy
Engelsk
Bogcover for Characterization of High Tc Materials and Devices by Electron Microscopy af , 9780521031707
Specifikationer
Sprog:
Engelsk
Sider:
408
ISBN-13:
9780521031707
Indbinding:
Paperback
ISBN-10:
0521031702
Udg. Dato:
23 nov 2006
Størrelse i cm:
24,3 x 16,8 x 2,1
Oplagsdato:
23 nov 2006

Characterization of High Tc Materials and Devices by Electron Microscopy

Engelsk
Paperback 2006
Format:

Bog beskrivelse
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
... Vis mere

Forlags Vejl. pris
512,68 kr
Hos Booktok
452 kr
spar 12%
Læg i kurv nu
Sikker betaling
23 - 25 hverdage

Specifikationer
Sprog:
Engelsk
Sider:
408
ISBN-13:
9780521031707
Indbinding:
Paperback
ISBN-10:
0521031702
Udg. Dato:
23 nov 2006
Størrelse i cm:
24,3 x 16,8 x 2,1
Oplagsdato:
23 nov 2006
Finder produkter...
Kategori sammenhænge