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CMOS RF Circuit Design for Reliability and Variability
Engelsk
Bogcover for CMOS RF Circuit Design for Reliability and Variability af Jiann-Shiun Yuan, 9789811008825
Specifikationer
Sprog:
Engelsk
Sider:
106
ISBN-13:
9789811008825
Indbinding:
Paperback
ISBN-10:
9811008825
Udg. Dato:
21 apr 2016
Størrelse i cm:
23,5 x 15,5
Oplagsdato:
21 apr 2016
Forfatter(e):

CMOS RF Circuit Design for Reliability and Variability

Engelsk
Paperback 2016
Format:

Bog beskrivelse
The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
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Specifikationer
Sprog:
Engelsk
Sider:
106
ISBN-13:
9789811008825
Indbinding:
Paperback
ISBN-10:
9811008825
Udg. Dato:
21 apr 2016
Størrelse i cm:
23,5 x 15,5
Oplagsdato:
21 apr 2016
Forfatter(e):
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