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High Resolution X-Ray Diffractometry And Topography
Engelsk
Bogcover for High Resolution X-Ray Diffractometry And Topography af D.K. Bowen, Brian K. Tanner, 9780367400637
Specifikationer
Sprog:
Engelsk
Sider:
264
ISBN-13:
9780367400637
Indbinding:
Paperback
ISBN-10:
0367400634
Udg. Dato:
10 okt 2019
Størrelse i cm:
24,6 x 17,4
Oplagsdato:
10 okt 2019
Forfatter(e):

High Resolution X-Ray Diffractometry And Topography

Engelsk
Paperback 2019
Format:

Bog beskrivelse
The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
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Specifikationer
Sprog:
Engelsk
Sider:
264
ISBN-13:
9780367400637
Indbinding:
Paperback
ISBN-10:
0367400634
Udg. Dato:
10 okt 2019
Størrelse i cm:
24,6 x 17,4
Oplagsdato:
10 okt 2019
Forfatter(e):
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