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  3. Elektronik: kredse og komponenter

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

Af: Alexandra Zimpeck, Cristina Meinhardt, Ricardo Reis, Laurent Artola Engelsk Paperback

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

Af: Alexandra Zimpeck, Cristina Meinhardt, Ricardo Reis, Laurent Artola Engelsk Paperback
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This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices.  The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regarding the area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.

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This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical properties of devices.  The authors also explore four circuit-level techniques (e.g. transistor reordering, decoupling cells, Schmitt Trigger, and sleep transistor) as alternatives to attenuate the unwanted effects on FinFET logic cells. This book also evaluates the mitigation tendency when different levels of process variation, transistor sizing, and radiation particle characteristics are applied in the design. An overall comparison of all methods addressed by this work is provided allowing to trace a trade-off between the reliability gains and the design penalties of each approach regarding the area, performance, power consumption, single event transient (SET) pulse width, and SET cross-section.

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Se mere i:
Produktdetaljer
Sprog: Engelsk
Sider: 131
ISBN-13: 9783030683702
Indbinding: Paperback
Udgave:
ISBN-10: 3030683702
Kategori: Elektronik: kredse og komponenter
Udg. Dato: 11 mar 2022
Længde: 0mm
Bredde: 155mm
Højde: 235mm
Forlag: Springer Nature Switzerland AG
Oplagsdato: 11 mar 2022
Forfatter(e): Alexandra Zimpeck, Cristina Meinhardt, Ricardo Reis, Laurent Artola
Forfatter(e) Alexandra Zimpeck, Cristina Meinhardt, Ricardo Reis, Laurent Artola

Kategori Elektronik: kredse og komponenter

ISBN-13 9783030683702

Sprog Engelsk

Indbinding Paperback

Sider 131

Udgave

Længde 0mm

Bredde 155mm

Højde 235mm

Udg. Dato 11 mar 2022

Oplagsdato 11 mar 2022

Forlag Springer Nature Switzerland AG

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